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MAIN MODULE UNIT (AULS-2000)

The AULT-2000 Main Module (Advanced Universal Lab Trainer) is a self-contained development tool for all types of analog and digital electronic circuits.
Located all around the 2200 tie points removable breadboard is a variety of functional input and output circuits, which can be used to stimulate of measure electrical signals from the circuit under test or development.
The AULT-2000 is shipped with a comprehensive user’s manual and a power cord.
Dimensions : (W x D x H) 465 x 330 x 150 mm
Weight : 6 KGS (Gross)
Input Voltage : AC240V, 50Hz (Fuse Protected)
SEPCIFICATIONS
1. Regulated DC Power Supplies Module
Fixed Output : -5V/1A, +5V/1A, +12V/1A, -12V/1A
Variable Output : +/-1.2V to +/-20V, -1.2V to 20V/1A
All power supplies are short circuit protected
2. AC Power Supplies Module
16.5V – 13.5 – 8.5 - 0 – 8.5 – 13.5 - 16.5V
3. Function Generator Module
Sine, Square, Triangle waveform output
Frequency range from 1 to 100KHz in 5 decade with Fine adjust
Amplitude Control
DC Offset
4. Frequency Counter Module
1Hz To 220KHz Auto Ranging
5. Clock Generator Module
Frequency Range from 1Hz to 100KHz in 5 decades
6. Removable Breadboard Module
with 2200 tie points
7. 3-State Logic Probe Module
with 7-segment display
8. Logic Switches Module
Provide two sets of Logic signal
9. Data Switches Module
Provide eight sets of HI / LO signal, HI = +5V, LO = 0V
10. Logic Indicators Module
Provide eight sets of LED Indicator with buffer
11. 2-Single Shot Pulse Generators Module
80uS Pulse
12. Two Level Switches Module
13. Two digits 7-Segment LED Display Binary Code Decimal & Binary Code Hexadecimal Module
14. Speaker Module
8Ohm, 0.25W
15. Potentiometer Module
With 1 K, 10K, 100K and 1M Ohm Potentiometers
16. Digital LCD Display Multimeter Module
DC Voltage : 200mV ~ 1000V.
DC Current : 2000uA ~ 10A
AC Voltage : 200mV ~ 750V rms
Resistance : 200ohm ~ 2000ohm
Diode Test
hFE
Logic Test
Transistor Test : NPN & PNP
Continuity Beep
17. Analog Multimeter Module
18. Programmable Capacitors Module
19. Programmable Resistors Module
20. Programmable Inductors Module
21. Computer Interface Module
Serial Interface
Parallel Interface
USB Interface
22. Plug & BNC Interface Module
EXPERIMENT MODULES
1. DT-EM01: Basic Logic Gates Experiments
2. DT-EM02: Assembled Logic Circuit Experiments (1)
3. DT-EM03: Assembled Logic Circuit Experiments (2)
4. DT-EM04: Assembled Logic Circuit Experiments (3)
5. DT-EM05: Assembled Logic Circuit Experiments (4)
6. DT-EM06: Assembled Logic Circuit Experiments (5)
7. DT-EM07: Clock Generator Circuit Experiments (1)
8. DT-EM08: Sequential Logic Circuit Experiments (1)
9. DT-EM09: Sequential Logic Circuit Experiments (2)
10. DT-EM010: Memory Circuit Experiments (1)
11. DT-EM011: Memory Circuit Experiments (2)
12. DT-EM012: Converter Circuit Experiments (1)
13. DT-EM013: Converter Circuit Experiments (2)
LIST OF EXPERIMENTS
1. Basic Logic Gates Experiments
1.1 Introduction to Logic and Switches 1.2 Logic Gates Circuit Experiments a. Diode Logic (DL) Circuit b. Resistor-Transistor Logic (RTL) Circuit c. Diode-Transistor Logic (DTL) Circuit d. Transistor-Transistor Logic (TTL) Circuit e. CMOS Logic Circuit 1.3 Threshold Voltage Measurement Experiments a. TTL Logic Circuit b. CMOS Logic Circuit 1.4 Voltage/Current Measurement Experiments a. TTL I/O Voltage/Current Output Measurement b. CMOS I/O Voltage/Current Output Measurement 1.5 Basic Logic Gate Transmission Delay Measurements a. TTL Logic Gate Transmission Delay Measurements b. Schmitt Gate Transmission Delay Measurements c. CMOS Transmission Delay Measurements 1.6 Measurement of Basic Logic Gates Characteristics a. AND Gate Characteristics Measurement b. OR Gate Characteristics Measurement c. Inverse Gate Characteristics Measurement d. NAND Gate Characteristics Measurement e. NOR Gate Characteristics Measurement f. XOR Gate Characteristics Measurement 1.7 Interface Between Logic Gates a. TTL to CMOS Interface b. CMOS to TTL Interface
2. Assembled Logic Circuit Experiments
2.1 NOR Gate Circuit Experiment 2.2 NAND Gate Circuit Experiment 2.3 XOR Gate Circuit Experiments a. With NAND Gate b. With Basic Equations 2.4 A-O-I Gate Circuit Experiment 2.5 Comparator Circuit Experiments a. With Basic Logic Gates b. With IC type TTL comparator 2.6 Schmitt Gate Circuit Experiment 2.7 Open Collector Gate Circuit Experiments a. High Voltage/Current Driver Circuit b. Constructing and AND Gate with Open Collector Gate 2.8 Three-State Gate Circuit Experiments a. True Table Measurement Experiment b. Constructing and AND gate with Three-State Gate c. Bidirectional Transmission Circuit 2.9 Half Adder and Full Adder Experiments a. With Basic Logic Gates b. Full Adder Circuit c. High-Speed Adder Carrier Generator d. BCD Code Adder Circuit 2.10 Half-Subtractor and Full Subtractor Experiments a. With Basic Logic Gates b. With Full Adder and Inverter Circuit 2.11 Arithmetic Logic Unit (ALU) Circuit Experiment 2.12 Bit Parity Generator Experiments a. With XOR Gate b. With IC Bit Parity Generator 2.13 Encoder Circuit Experiments a. Constructing a 4 to 2-bit Encoder with Basic Logic Gates b. Constructing a 10 to 4-bit Encoder with TTL IC 2.14 Decoder Circuit Experiments a. Constructing a 4 to 2-bit Decoder with Basic Logic Gates b. Constructing a 10 to 4-bit Decoder with TTL IC c. Decoding 7-segment Display with BCD Code 2.15 Multiplexer Circuit Experiments a. Constructing a 2 to 1-bit Multiplexer with Basic Logic Gates b. Using multiplexer to Create Functions c. Constructing a 8 to 1-bit Multiplexer with TTL IC 2.16 Demultiplexer Circuit Experiments a. Constructing a 1 to 2-bit Demultiplexer with Basic Logic Gates b. Constructing a 1 to 8-bit Demultiplexer with CMOS IC 2.17 Digitally Controlled Analog Multiplexer / Demultiplexer Circuits a. Characteristics of Analog Switches b. Bidirectional Transmission with CMOS IC Analog Switches
3. Clock Generator Circuit Experiments
3.1 Constructing Oscillator Circuit with Basic Logic Gates 3.2 Constructing Oscillator Circuit with Schmitt Gate 3.3 Voltage Controlled Oscillator (VCO) Circuit 3.4 555 IC Oscillator Circuit Experiments a. 555 Oscillator Circuit b. Voltage Controlled Oscillator Circuit 3.5 Monostable Multivibrator Circuit Experiments a. Low-Speed Monostable Multivibrator Circuits a.1 Non-Retriggerable circuit a.2 Retriggerable Circuit b. High-Speed Monostable Multivibrator Circuits b.1 Non-Retriggerable circuit b.2 Retriggerable Circuit c. Constructing Monostable Multivibrator with 555 Trigger d. Constructing Non-Retriggerable Circuit with TTL IC e. Constructing Retriggerable Circuit with TTL IC f. Constructing a Variable Duty Cycle Oscillator Circuit with Monostable Multivibrator.
4. Sequential Logic Circuit Experiments
4.1 Constructing a R-S Flip-Flop with Basic Logic Gates 4.2 Constructing a D Flip-Flop with a R-S Flip-Flop 4.3 Constructing a T Flip-Flop with a D Flip Flop 4.4 Constructing a J-K Flip-Flop with a R-S Flip-Flop 4.5 Constructing a Shift Register with D Flip-Flop a. Serial-in Serial-Out Shift Register b. Serial-in Parallel-Out Shift Register c. Parallel-in Serial-Out Shift Register d. Parallel-in Parallel-Out Shift Register 4.6 Preset Left/Right Shift Register Circuit Experiment 4.7 Noise Elimination Circuit with R-S Flip-Flop 4.8 Constructing Counter with J-K Flip-Flop a. Asynchronous Binary Up-Counter Circuit b. Asynchronous Decimal Up-Counter Circuit c. Asynchronous Divide-by-N Up-Counter Circuit d. Asynchronous Binary Down-Counter Circuit e. Synchronous Binary Up-Counter Circuit f. Synchronous Binary Up-Down Counter Circuit g. Preset Synchronous Binary Up/Down Counter Circuit h. Preset Synchronous Decimal Up/Down Counter Circuit i. Ring Counter Circuit j. Johnson's Counter Circuit
5. Memory Circuit Experiments
5.1 Constructing READ ONLY MEMORY (ROM) with Diodes 5.2 Constructing RANDOM ACCESS MEMORY (RAM) with D Flip-Flop 5.3 64-bit RAM Circuit 5.4 ERASABLE PROGRAMMABLE READ ONLY MEMORY (EPROM) Circuit 5.5 Electronic EPROM (EEPROM) Circuit 5.6 Constructing Dynamic Scanning Counter with Single-Chip Microprocessor
6. Converter Circuit Experiments
6.1 Digital/Analog Converter Circuit Experiments a. Unipolar Output Converter Circuit b. Bipolar Output Converter Circuit 6.2 Analog/Digital Converter Circuit Experiments a. 8-bit Converter Circuit b. 3 1/2-digit Converter Circuit
7. Circuit Application Experiments
7.1 4-channel Trigger Selector 7.2 Tone-Adjustable Electronic Organ 7.3 Level Indicator 7.4 Monostable Coded Lock 7.5 Depth Monitor 7.6 Electronic Stopwatch 7.7 Flashing Light with Metronome 7.8 Entrance/Exit Counter 7.9 Multiple Switches 7.10 Electronic Clock 7.11 Frequency Counter 7.12 Telephone Ringing Generator
ACCESSORIES (DT-MA)
A. Connect Leads : 1) 2mm ~ 0.65mm, 300mmL, 6pcs
2) 2mm ~ 2mm, 450mmL, 10pcs
B. Test Probe : 2mm ~ 2mm, 600mmL, 1pc
C. Connect Plugs : Ř2mm, 10mmL
D. Experiment manual and Instructor's manual
E. User's Manual
F. Fuse
G. AC Cord
H. Anti-Dust Cover
I. Key - 1 pc
GENERAL CHARACTERISTICS
A. Main Module Unit dimension: (W x D x H) 390 x 345 x 130 mm
B. Module dimension: (W x D x H) 255x165x30mm
C. Power Source : 240V ± 10%, 50Hz
D. Operating Temperature : 0° C ~ 50° C
E. Humidity : < 90% relative humidity |